EL
Detection principle
· After applying a voltage to the solar cell/module to make it emit light, a near-infrared camera is used to capture its light-emitting image, because the brightness of electroluminescence is proportional to the minority carrier diffusion length
· The defect emits weak light due to its low minority carrier diffusion length, resulting in a darker image
Schematic Diagram
Device parameters
| Project | Specification |
| Model Specifications | EL140S-M |
| Effective test area | 170mm X 170m |
| Resolution | 1.4 million pixels |
Sensitivity | Can detect defects with contrast >5 |
Testing time | 0.6s—10s free setting |
Test method | Probe Contact |
Power parameters | Single-phase 220V 10A, maximum load voltage 60V, maximum load current 10A |
| Configuration | Test machine (including infrared imager), computer, professional software |
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